The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Sep. 17, 2003
Applicant:
Inventor:
Yukihiro Isa, Tateyama, JP;
Assignee:
UMC Japan, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/100 ;
U.S. Cl.
CPC ...
G01R 3/100 ;
Abstract
This invention provides a cantilever type probe card which has undergone a treatment for facilitating perception of the image of probe needles. This invention, in the probe card having disposed at prescribed positions on the probe card main body such probe needles furnished with bent pars having the leading terminals thereof directed toward an object under test, forms in a at least the parts of the probe needles including the bent parts such reflection lowering parts adapted to repress the reflection of light.
Isa, Yukihiro. (2004). Cantilever type probe card and method for production thereof (U.S. Patent No. 6774652). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6774652
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile