The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Jan. 25, 2002
Susumu Yoshida, Kawasaki, JP;
Shuichi Hashimoto, Kawasaki, JP;
Ryuki Kubohara, Kawasaki, JP;
Tatsuhiko Kosugi, Kawasaki, JP;
Takeyori Hara, Kawasaki, JP;
Yoshiyuki Kagami, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A resonance-frequency measuring method is used for measuring a resonance frequency of an information recording/reproducing device reproducing information recorded on a medium by driving a mechanism unit. The resonance-frequency measuring method comprises the measuring step of applying sine-wave oscillations at different frequencies one by one to the mechanism unit, and counting the number of times information reproduced upon application of each of the sine-wave oscillations differs from information indicating an aimed location, and the resonance-frequency determining step of determining the resonance frequency according to the number of times counted in the measuring step.