The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Dec. 05, 2001
Markus Oechsle, Bartholomä, DE;
Frank Wegehaupt, Böhmenkirch, DE;
Voith Paper Patent GmbH, Heidenheim, DE;
Abstract
Method and apparatus for determining characteristics of a running material web, the apparatus including at least one measuring device. The at least one measuring device is movable and has at least two degrees of freedom of movement. Each of the at least two degrees of freedom of movement is at least one of a rotary movement and a linear movement. The at least one measuring device is adapted to detect, at a plurality of measurement locations, data relating to at least one measured parameter. The at least one measuring device detects data about at least one of the following measured parameters: measured parameters which relate to a characteristic value of air in a region of the material web; measured parameters which relate to the material web; and other measured parameters. The method includes detecting, at a plurality of measurement locations and using the at least one measuring device, data relating to at least one measured parameter.