The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Aug. 24, 2001
Applicant:
Inventors:
Damian A. Hajduk, San Jose, CA (US);
Eric D. Carlson, Cupertino, CA (US);
J. Christopher Freitag, Santa Clara, CA (US);
Oleg Kolosov, San Jose, CA (US);
James R. Engstrom, Ithaca, NY (US);
Adam Safir, Berkeley, CA (US);
Ravi Srinivasan, Mountain View, CA (US);
Leonid Matsiev, San Jose, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 ;
U.S. Cl.
CPC ...
G01N 3/08 ;
Abstract
A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.