The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Oct. 30, 2001
Russell M. Matney, Lynchburg, VA (US);
Mihai G. Pop, Lynchburg, VA (US);
Joseph R. Wyatt, III, Lynchburg, VA (US);
Framatome Anp, Inc., Lynchburg, VA (US);
Abstract
A method for sizing cracks is disclosed using a combination of depth crack sizing methods to improve crack sizing accuracy for thin walled tubing and tight crack surface openings less than 0.001 inches for cracks of any depth. The tube or plate wall can consist of a single material or multiple metallic electrodeposited or otherwise intimately bonded layers of materials with different magnetic properties and the sizing method comprises known depth sizing methods such as shear wave, time of flight and the selective use of two unique depth sizing methods designated as Mode Converted Signal (MCS) and Full Skip Normalization (FSN) which provide correction factors for the known sizing methods.