The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Nov. 30, 2000
Applicant:
Inventors:

Lih-Jyh Weng, Shrewsbury, MA (US);

Dana Hall, Hopkinton, MA (US);

Assignee:

Quantum Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/315 ;
U.S. Cl.
CPC ...
H03M 1/315 ;
Abstract

A method of determining error values including loading an error correction code (ECC) entity having rows representing data symbols, determining an error location for a first row, generating an error syndrome for the first row, determining an erasure constant array from the error location, determining an error location for each of the remaining rows, generating an error syndrome for each of the remaining rows and determining the error values for each of the rows from the corresponding error location and corresponding error syndrome and the constant.


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