The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
Nov. 03, 2000
Xiao Sun, Austin, TX (US);
John C. Chan, Watauga, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method and apparatus to generate test sequences for pipeline hazards in a pipelined data processing system is presented. An executable specification for the architecture is compiled that includes macroarchitecture and microarchitecture information corresponding to each of the instructions supported by the architecture. A table ( ) is constructed from the executable specification that specifies the particular resource utilization parameters associated with each of the instruction types included in the instruction set supported. From this table a resource utilization parameter list ( ) is compiled that indicates the relative times at which resources are needed by each instruction and when these resources are released by the instruction. Comparisons between different entries in the resource utilization parameter list corresponding to the same resource are performed such that potential hazards are detected. A hazard list ( ) is then compiled that includes all of the hazards detected through the comparison operations utilizing the resource utilization parameter list ( ). This hazard list ( ) can then be used generate and qualify test sequences and to determine if hardware or software is overcompensating or undercompensating for the potential hazard conditions.