The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
Sep. 03, 2002
Horst Müller, Schriesheim, DE;
Jan Olsen, Malsch, DE;
Thomas Lendroth, Leimen-Gauangelloch, DE;
Marc Webster, Heidelberg, DE;
Nils Kirstaedter, Berlin, DE;
Jens Fichtner, Leipzig, DE;
Michael Schaffrath, Leipzig, DE;
SAP Aktiengesellschaft, Walldorf, DE;
Abstract
Methods and apparatus, including computer program products, providing a test configuration having an associated test script and one or more associated data containers. Each data container defines a set of parameters and one or more sets of variants, each set of variants specifying a value for each of the parameters in the set of parameters. Each data container is reusable with multiple test configurations. The test script has a set of test parameters and the test configuration further has a set of test parameter variants, each of the test parameter variants being a set of values for respective test parameters in the set of test parameters. The test parameter variants include one or more references for obtaining data values from one or more of the associated data containers.