The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Oct. 09, 2002
Applicant:
Inventor:

Takahisa Uehira, Mobara, JP;

Assignee:

Futaba Corporation, Mobara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/800 ;
U.S. Cl.
CPC ...
G01D 1/800 ;
Abstract

A length measuring apparatus is provided that combines upper data with lower data and then outputs the composite data. The apparatus monitors taking down or up a digit of upper data or lower data and synchronization of lower data, thus preventing an occurrence of reading error. When an A/D area showing an area of lower data matches with an upper area quadrant showing an area of upper data (R , R ), the upper count value outputting the upper data is output without any change. When the quadrant (0, 1, 2, 3) of the A/D area does not match with the quadrant (0, 1, 2, 3) of upper area because of an erroneous timing of a digit-taking-up of upper data (R , R ), +1 or −1 is added to the upper count value. Thus, the continuity of a measured value can be obtained when the scale is being moved.


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