The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
May. 18, 2000
Dimitrios Ioannou, Fremont, CA (US);
Mark Damon Wheeler, Oakland, CA (US);
Leica Geosystems HDS, Inc., Oakland, CA (US);
Abstract
An apparatus and method are described that allow a surface of interest to be defined by the selection of a seed point that lies on the surface of interest. When a single seed point is defined, additional points that are in the vicinity of the seed point are grouped with the seed point to form a first set of points. When multiple seed points are defined, additional points that are in the vicinities of the seed points are grouped with the seed points to form the first set of points. The first set of points, along with a surface type, are then used to define a candidate surface. Following this, a second set of points is defined using the seed points and additional points that fall within a predefined distance of the candidate surface. The second set of points are partitioned into groups, and the groups that include the seed points along with the surface type are then used to redefine the candidate surface.