The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Sep. 27, 1999
Applicant:
Inventors:

Gheorghe Berbecel, Richmond Hill, CA;

Steve Selby, Scarborough, CA;

Assignee:

Genesis Microchip Inc., Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 ;
U.S. Cl.
CPC ...
G06K 9/40 ;
Abstract

A method for generating from an input signal with a predetermined input spatial resolution a high contrast rescaled image having a predetermined output spatial resolution which differs from the input spatial resolution, comprising the steps of generating output samples from input samples of the input signal, detecting predetermined ones of the output samples which occur in excess of a predetermined time threshold from nearest occurring ones of said input samples detecting image details in the input signal at the nearest occurring ones of the input samples, and shifting the predetermined ones of the output samples so as to substantially align with the image details and thereby enhance image contrast of the details.


Find Patent Forward Citations

Loading…