The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Jul. 13, 2000
Applicant:
Inventors:

Yoshikazu Naito, Yokohama, JP;

Shinichi Sato, Yokohama, JP;

Fumiko Koshimizu, Machida, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/36 ;
Abstract

Error addition section generates correction data by adding correction value Emo and correction value E to the input data. Binary processing section converts the correction data to binary data to generate output data. Binary error calculation section calculates binary error E based on the correction data and output data. Propagation coefficient judgment section judges propagation coefficients K to K Propagation error operation section operates on binary error E and propagation coefficients K to K to calculate correction value E and correction value Emi. Error memory temporarily stores correction value Emi, and outputs it to error addition section when the pixel data to be corrected is input.


Find Patent Forward Citations

Naito, Yoshikazu. (2004). Image processor for processing an image with an error diffusion process and image processing method for processing an image with an error diffusion process (U.S. Patent No. 6771832). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6771832

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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