The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Jul. 14, 2000
Applicant:
Inventors:

Dennis W. Davis, Eustis, FL (US);

James H. Michels, Henderson, NY (US);

Jaime R. Román, Palm Beach Gardens, FL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/10 ;
U.S. Cl.
CPC ...
H04B 1/10 ;
Abstract

Disclosed is an apparatus and method for improving the detection of signals obscured by either correlated Gaussian or non-Gaussian noise plus additive white noise. Estimates from multichannel data of model parameters that describe the noise disturbance correlation are obtained from data that contain signal-free data vectors, referred to as “secondary” or “reference” cell data. These parameters form the coefficients of a multichannel whitening filter. A data vector to be tested for the presence of a signal passes through the multichannel whitening filter. The filter output is then processed to form a test statistic. The test statistic is compared to a threshold value to decide whether a signal is “present” or “absent.” The method is effective in detecting targets without knowledge of the non-Gaussian noise statistics.


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