The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6771453 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 03, 2004

Filed:

Nov. 05, 2001
Applicant:
Inventors:

Bradley Frederick Baumgartner, Los Banos, CA (US);

An-Chou Andrew Chen, San Jose, CA (US);

Norman H. Chu, San Francisco, CA (US);

Shanlin Duan, Fremont, CA (US);

Patricia Galindo, Sunnyvale, CA (US);

Roger Yu Lo, Fremont, CA (US);

Connie H. Moy, San Jose, CA (US);

Hang Fai Ngo, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 2/102 ;
U.S. Cl.
CPC ...
G11B 2/102 ;
Abstract

A calibration method for determining the flying height of a glide slider for disk glide height testing is disclosed. The method utilizes a disk with bumps in situ on a disk glide height tester. The method automatically takes into account disk topography, mounting tolerances, and slider roll.


Find Patent Forward Citations

Baumgartner, Bradley. (2004). Glide slider fly height calibration method using disk spin down and slider dynamic scan (U.S. Patent No. 6771453). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6771453

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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