The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
Sep. 19, 2001
Applicant:
Inventors:
Yasuteru Takahama, Kodaira, JP;
Shunichi Kubota, Hino, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/136 ; G02B 2/300 ;
U.S. Cl.
CPC ...
G02B 2/136 ; G02B 2/300 ;
Abstract
An inverted microscope comprises an image output port that forms an image of an observation sample to the external surface facing to an observer, at the front side of a microscope main body, below an observation tube to which eyepieces are attached, and photographing devices configured that one of at least two kinds of photographing devices is selectively attachable/detachable to the image output port.
Quick Actions:
Takahama, Yasuteru. (2004). Inverted microscope (U.S. Patent No. 6771416). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6771416
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile