The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Jul. 07, 2000
Applicant:
Inventors:

Nobuo Nakanishi, Kanagawa, JP;

Hajime Yamamoto, Kanagawa, JP;

Satoshi Segawa, Kanagawa, JP;

Tomoaki Fukano, Tokyo, JP;

Masato Iwakawa, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract

The present invention provides an image scanning apparatus including a stand block having a support arm , a scan type illumination device for applying a slit-shaped light beam onto a surface of a manuscript , and a manuscript image scanning device mounted on the support arm for receiving the slit-shaped light beam reflected from the surface of the manuscript and having a manuscript image. The scan type illumination device applies the slit-shaped light beam in a direction vertical to the longitudinal direction of the slit-shaped light beam . The manuscript image scanning device includes a manuscript image input block and a light detecting device for receiving the reflected light ′ output from the manuscript image input block . The manuscript image input block , in synchronization with the scan operation of the scan type illumination device , introduces the reflected light ′ into a predetermined position of the light detecting device


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