The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
Nov. 26, 2002
Keisuke Kawabata, Tokyo, JP;
Hitachi Cable, Ltd., , JP;
Abstract
A method and an apparatus for measuring wavelength dispersion value and/or nonlinear coefficient of optical fibers which realize high accurate nonlinear coefficient and wavelength dispersion value without influence of emitting power at measurement, length of test optical fiber, wavelength spacing of light source, and varying wavelength dispersion value of light source are provided. An apparatus is comprising a spectrum analyzer for measuring four wave mixing optical intensity generated in test optical fiber by emitting pump light and signal light to test optical fiber for each peak wavelength spacing, and for measuring optical intensity of a plurality of line spectrum constituting pump light and a plurality of line spectrum constituting signal light respectively, and an operating circuit for obtaining nonlinear coefficient and/or wavelength dispersion value by calculating so that maximum value of four wave mixing optical intensity in each spectrum wavelength spacing calculated from optical strength of line spectrum of pump light and signal light measured by spectrum analyzer coincides with measured value of four wave mixing optical intensity in each spectrum wavelength spacing measured by spectrum analyzer.