The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
May. 29, 2002
Richard Jacob Wilcox, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A test fixture having an adjustable capacitance ( ) and a method for testing a semiconductor component using the test fixture ( ). The test fixture ( ) includes a loadboard ( ) having a semiconductor component receiving area ( ), and a power supply input terminal ( ) capable of receiving an unbuffered constant current bias signal from a power supply ( ). A semiconductor component is coupled to the semiconductor component receiving area ( ). A switched capacitor network ( ) mounted on the test fixture ( ) is configured so that a desired load capacitance is coupled to the power supply input terminal ( ) when the semiconductor component is initialized. Then the switched capacitor network ( ) is configured so that substantially zero capacitance is coupled to the power supply input terminal. Power supply voltage fluctuations are mapped while the semiconductor component is biased with the power supply and receiving a voltage alteration signal from a laser.