The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2004

Filed:

Nov. 21, 2002
Applicant:
Inventor:

Ronald L. Hansen, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/10 ;
U.S. Cl.
CPC ...
G09G 3/10 ;
Abstract

The present invention is a system and method for monitoring FED performance and compensating for adverse impacts associated with display emission generation. A present invention FED adjustment system and method is capable of providing real time emission characteristic monitoring during retrace periods. In one present emission compensation method a feedback type process is utilized that drives a constant level on dummy pixels not included in the active viewing area and compares the results (e.g., the current that is associated with the emission) to an expected certain predetermined amount. If the current is too high then the voltage supply is reduced to the drive level or if the current is to low the voltage is increased. A driver voltage is supplied and an image is presented in an active pixel region during an active presentation time. Emissions are produced in a test pixel during a nonactive presentation and a determination is made if the emissions in the test area are accurate. If the emissions are not accurate, adjustments to the pixels are made to provide a desired level.


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