The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2004
Filed:
Mar. 13, 2001
Applicant:
Inventors:
Heon Cheol Kim, San Jose, CA (US);
Jin-Young Park, Kyunggi-do, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ; G06F 1/200 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G06F 1/100 ; G06F 1/200 ; G01R 3/128 ;
Abstract
A built-in self test (BIST) circuit and method is provided for testing semiconductor memory. A linear feedback shift register (LFSR) is used for addressing the memory locations to be tested. Test data is derived at least partially from the address data generated from the linear feedback shift register.