The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6768972 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 27, 2004

Filed:

Jun. 04, 2001
Applicant:
Inventors:

Stefan Schäffler, Augsburg, DE;

Thomas Sturm, München, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/500 ;
Abstract

A method and system for screening out empirically data collected from various steps of a technical process operating based on a first set of parameters, by utilizing a screening algorithm to reduce the size of the empirical data set, thus improving the modeling and revising of the technical process. The algorithm utilizes various classes associated with the empirical values and within each class performs an assessment with respect to preselected threshold values. The algorithm also performs an assessment with respect to another preselected threshold value, for the class as a whole.


Find Patent Forward Citations

Schäffler, Stefan. (2004). Method and device for reducing a number of measured values of a technical system (U.S. Patent No. 6768972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6768972

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