The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2004
Filed:
Aug. 16, 2001
Mark Dugan, Ann Arbor, MI (US);
William Clark, Pittsford, NY (US);
Ali A. Said, Ann Arbor, MI (US);
Robert L. Maynard, Gregory, MI (US);
Philippe Bado, Ann Arbor, MI (US);
Translume, Inc., Ann Arbor, MI (US);
Abstract
A method of using a beam of ultra-short laser pulses, having pulse durations below 10 picoseconds, to adjust an optical characteristic within an optical medium is provided. The beams would have an intensity above a threshold for altering the index of refraction of a portion of the optical medium. The beams could be selectively applied to the optical medium and any structures formed or existing therein. Thus, the beam could be moved within a waveguide in the optical medium to alter the index of refraction of the waveguide forming any number of different longitudinal index of refraction profiles. The beam could also be moved within the optical medium near the waveguide to alter an effective index of refraction of a signal traveling within the waveguide. The techniques described can be used to improve, alter or correct performance of waveguide-based optical devices, such as arrayed waveguide gratings and cascaded planar waveguide interferometers.