The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2004

Filed:

May. 20, 2003
Applicant:
Inventors:

Paul C. Werntz, Long Beach, CA (US);

Sien-Chang C. Liu, Brea, CA (US);

Lauriston Wah, Manhattan Beach, CA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/22 ;
U.S. Cl.
CPC ...
H01Q 3/22 ;
Abstract

A method for detecting calibration probe displacement for a phased array antenna includes steps of: creating a gold standard set of antenna element phases of the phased array antenna; determining a set of element phase sensitivities of the phased array antenna; measuring a set of antenna element phases relative to array displacement of the phased array antenna; and forming a set of equations using the gold standard set of antenna element phases, the set of element phase sensitivities, and the set of antenna element phases relative to array displacement. The set of equations has an array displacement vector x as unknown; and solving the set of equations for the array displacement vector x provides the location and orientation of the calibration probe displacement.


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