The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6768430 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 27, 2004

Filed:

Mar. 19, 2003
Applicant:
Inventor:

Michael J. Weinstein, Los Altos, CA (US);

Assignee:

Agilent Technologies, Inc., Plao Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 7/00 ;
U.S. Cl.
CPC ...
H03M 7/00 ;
Abstract

The present invention is directed to a system and method which expands the applicability of subsampling to a larger range of signal repetition rates while reducing the range over which the sample rate must be tuned to accommodate a given signal. The resulting sample sequences are in the correct order, enabling direct display with an ordinary oscilloscope or other instrumentation. In one embodiment, a technique is used such that decimation of the samples also improves the response characteristics of the sensor. The system and method provides for a number of different procedures for sampling a signal of a given length. All other parameters being the same, the system allows more freedom in selecting the sample rate to correctly sub-sample a repetitive signal.


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