The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2004
Filed:
Jan. 03, 2002
Henning Möller, Hamburg, DE;
Jorg Tobias, Drage, DE;
Hauni Maschinenbau AG, Hamburg, DE;
Abstract
A method of detecting impurities in a mass, such as detecting metallic and/or plastic particles in a stream of tobacco particles or filter material for tobacco smoke, includes the steps of moving the mass relative to a microwave field and/or vice versa, and analyzing the influence of the mass upon the microwave field. The analyzing step involves simultaneously measur- the actual values of a first and a second parameter of the microwave field, ascertaining the presence or absence of those changes of the parameters which are attributable to the presence of impurities in the mass, determining whether or not the changes are within an acceptable range, and generating signals for segregation of impurities-containing portions of the mass from the other portions when the changes are outside of the acceptable range.