The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2004
Filed:
Mar. 04, 2002
Applicant:
Inventor:
Friedrich Hapke, Winsen/Luhe, DE;
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01R 1/04 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01R 1/04 ;
Abstract
The invention relates to an arrangement for testing an integrated circuit ( ). In order in this case to avoid a test vector memory and an on-board test system, a data word generator ( ), which supplies deterministic data words, means ( ) for test pattern generation, which modify the deterministic data words such that prescribed test patterns are produced which can be fed to inputs of an integrated circuit ( ) to be tested, and comparison means ( ) for comparing test output patterns of the integrated circuit ( ) with desired output patterns.