The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 2004
Filed:
May. 03, 2002
Michael F. Berman, Ansonia, CT (US);
Herbert R. Gram, Madison, CT (US);
Randolph L. Boncek, Hamden, CT (US);
Linda A. Averill, West Haven, CT (US);
Remote Data Technologies, LLC, New Haven, CT (US);
Abstract
A system is presented for remotely measuring a concentration of a target material (e.g., radioactive gas, suspended aerosols or non-radioactive gaseous chemistries). The system includes a data processing system and a monitoring device. The device includes a detector having a chamber, collector in the chamber and a sensor. The target material enters the chamber. The collector collects ions generated by decay of the material. In one embodiment, the sensor measures changes in an electrostatic potential of the collector in response to the ions. In another embodiment, the sensor includes a scintillation counter that measures alpha or beta particles and provides an energy spectrum. In another embodiment, the sensor includes a material whose optical properties vary according to fields formed within the sensor. The device includes a transmitter for transmitting the potential, the spectrum or the field strength to the processing system for determining the concentration of the target material.