The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 2004

Filed:

Jul. 21, 1999
Applicant:
Inventors:

Craig S. Chamberlain, Woodbury, MN (US);

Dean E. Feyma, Sandstone, MN (US);

Steven J. Heilig, St. Paul, MN (US);

Elaine M. Yorkgitis, St. Paul, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/772 ;
U.S. Cl.
CPC ...
G01N 2/772 ;
Abstract

A method of measuring inductance or inductive reactance of a sample is provided. The method comprises the steps of: (a) providing an instrument for measuring the inductance or the inductive reactance of the sample; (b) subjecting a portion of the instrument to different temperatures and recording data corresponding to the performance of the instrument portion at each temperature; (c) measuring the inductance or the inductive reactance of the sample using the instrument; and (d) correcting the measurement of inductance or inductive reactance for temperature based on the performance data.


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