The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Jul. 26, 2001
Nobuaki Takeuchi, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
The invention provides a structure that does not employ complicated and large-scale control circuits or control memory, minimizes the circuits for real time processing, and allows the use of refresh memory. The invention provides a test clock ( - ) comprising a data processing apparatus ( - ) provided for each electrode pin of the measured device ( ), a memory ( - ) that carries out reading and writing of the test pattern data and the like, a first-in-first-out element ( - ) that executes queue processing of the data read out from the memory, a delay circuit ( - ) that delays the output signal of the first-in-first-out element, and a measured device driver ( - ) that inputs into the electrode pin the output signal of the delay circuit, and in which the data processing apparatus ( - ) of adjacent test blocks are connected into a loop via the input-output circuit ( - ).