The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2004

Filed:

Jun. 12, 2003
Applicant:
Inventors:

Kyle T. Grucci, Nashua, NH (US);

Raman Vellayappan, Arlington, MA (US);

Thomas J. Kincaid, North Andover, MA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/136 ;
U.S. Cl.
CPC ...
G06F 1/136 ;
Abstract

A method of automatically performing a component test at any number of locations in a distributed environment is disclosed. In general, in order to assure compatibility of the various components in an enterprise computing system, a service test is created as part of a compatibility test suite and passed to a test application server having a test application program. The test application program includes a generic vehicle class that includes a plurality of vehicle class invokers each of which is used to implement each of the object types that are run in each of a plurality of containers. During the build process of the CTS, each service test is automatically packaged with each of the appropriate vehicle classes so that each can be deployed into and run within the associated container.


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