The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Nov. 15, 2000
Applicant:
Inventors:
Stephen R. Handley, Houston, TX (US);
Jeffrey Scott Hayes, Houston, TX (US);
Rocky Chau-Hsiung Lin, Fairfield, OH (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/717 ;
U.S. Cl.
CPC ...
G06F 1/717 ;
Abstract
A method for converting sample rates includes obtaining coefficients from a sample rate conversion coefficient table. In this method, the table is generated prior to the real-time sample rate conversion using LaGrange Interpolation based on the ratio of the input sample rate to the output sample rate.