The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Feb. 13, 2003
Todd Guay, Nashua, NH (US);
Jonathan Soule, Belmont, CA (US);
Yong Feng, Foster City, CA (US);
Vipul Shah, Mountain View, CA (US);
Geoffrey Wilson, Nashua, NH (US);
Jay Rossiter, Palo Alto, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
An intelligent approach for collecting statistical information in information systems generally involves performing a set of administrative function steps within a “maintenance window” that is defined by one or more specified time periods. First, a set of administrative function steps to be performed are identified. The set of administrative function steps is prioritized to produce a set of prioritized administrative function steps. Then, the set of prioritized administrative function steps is performed during the maintenance window. Aspects and features of the invention include: identifying and prioritizing administrative function steps; estimated function times and maintenance window; failure prediction; environment recommendations; history information and learning techniques; saving state and context information; and user feedback.