The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Nov. 12, 2002
Morinobu Ishiyama, Hiroshima, JP;
Jun Kobayashi, Hiroshima, JP;
IHI Marine United Inc., Tokyo, JP;
Abstract
A distribution of bending principal strains giving a target shape of a curved surface is obtained (Step S ), and a calculation grid is divided along the direction of the bending principal strains (Step S ). A database storing actual measurement values of relations between heating conditions and deformation amounts is prepared (Step S ). The directions of the bending principal strains are divided into the directions of the maximum and minimum bending principal strains (Step S ) for each calculation grid. Then, a heating condition for obtaining a bending strain satisfying the maximum bending principal strain is obtained by a heating line perpendicular to the direction of the maximum bending principal strain, and a membrane strain generated accompanying with heating in this case is obtained by referring to the database (Step S ). Membrane strains generating a deflection of the target shape of a curved surface are calculated in consideration of the distribution of the membrane strains obtained in Step S , and a heating condition satisfying the membrane strains in the two principal axis directions is obtained (Step S ). Then, a heating procedure is determined (Step S ).