The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2004

Filed:

Aug. 02, 2002
Applicant:
Inventors:

Dae Suk Jung, Santa Clara, CA (US);

Kyung Lee, Santa Clara, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

One embodiment of the present invention provides a system for calibrating a model of a digital circuit to account for noise effects between signal lines. The system operates by first fabricating a digital circuit for calibration purposes. Next, an input signal is applied to an aggressor net within the digital circuit. The system then measures how noise from the input signal affects the amplitude of a signal on a victim net within the digital circuit. Finally, the system adjusts parameters of the circuit model using the measured results.


Find Patent Forward Citations

Jung, Dae. (2004). Method and apparatus for calibrating parameters to be used in a digital circuit simulation (U.S. Patent No. 6766264). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6766264

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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