The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Mar. 13, 2002
Macyln Burns, Danbury, CT (US);
Anthony DeRubeis, Danbury, CT (US);
Paul Albats, Jr., Ridgefield, CT (US);
Robert Casadonte, Austin, TX (US);
Ralf Birken, Boston, MA (US);
Ross Deming, Winchester, MA (US);
Jakob Haldorsen, Norwalk, CT (US);
Thorkild Hansen, Brighton, MA (US);
Douglas E. Miller, Sandy Hook, CT (US);
Michael L. Oristaglio, Newtown, CT (US);
Witten Technologies Inc., Boston, MA (US);
Abstract
An apparatus and method for combining a survey measurement dataset and a position dataset into a single dataset containing both measurement and position data is disclosed. The survey measurement data may be obtained from a ground penetrating radar, an inductometer, a magnetometer, or an optical camera. Positioning information is collected and merged with the survey information so that the position of the survey tool is known at each data point. Also provided are channel-equalization filters, spiking deconvolution filters, and frame filters that can be used in conjunction with the positioning information to enhance the quality of the images obtained from the data collected by the survey tool.