The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2004

Filed:

Nov. 19, 2002
Applicant:
Inventors:

David D. Needelman, Torrance, CA (US);

Yeong-Wei A. Wu, Rancho Palos Verdes, CA (US);

Rongsheng Li, Hacienda Heights, CA (US);

Assignee:

The Boeing Company, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 1/00 ;
U.S. Cl.
CPC ...
G05D 1/00 ;
Abstract

Attitude acquisition methods and systems are provided which reduce the time generally required to acquire spacecraft attitude estimates and enhance the probability of realizing such estimates. The methods and systems receive, over a time span &Dgr;t, successive frames of star-sensor signals that correspond to successive stellar fields-of-view, estimate spacecraft rotation &Dgr;r throughout at least a portion of the time span &Dgr;t, and, in response to the spacecraft rotation &Dgr;r, process the star-sensor signals into a processed set of star-sensor signals that denote star positions across an expanded field-of-view that exceeds any of the successive fields-of-view. The expanded field-of-view facilitates identification of the stars that generated the processed set of star-sensor signals to thereby acquire an initial attitude estimate.


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