The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Nov. 30, 1999
Kai Huang, Cecil Hills, AU;
Yu-Ling Chen, Epping, AU;
Peter Leslie Bell, Normanhurst, AU;
Michael John Webb, West Denistone, AU;
Yoong-Chert Foo, Villeneuve Loubet Cedex, FR;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Disclosed is method of detecting a predetermined mark ( ) forming part of an image. A digitized form ( ) of the image ( ) comprising a plurality of picture elements is provided and within a current region of the image a set of features is determined. The features typically comprise a dominant color feature ( ) within the current region; and at least one moment feature ( ) based on picture elements pertaining to the predetermined mark within the current region. Each determined feature is compared ( ) with a corresponding predetermined feature ( ) of the predetermined mark. Using the comparison, a confidence level for a detection of said predetermined mark within the current region calculated. Based on the confidence level, whether or not said predetermined mark is detected in the current region can then be determined. Adjunct to the above method, also disclosed are methods for providing multiple encoded representations ( ) of the image, detecting a center location ( ) of a predetermined pattern in the image, and determining ( ) a moment feature of a portion of the image.