The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Dec. 29, 1999
Applicant:
Inventors:
Hitoshi Saito, Sapporo, JP;
Tetsuo Tajima, Chita-gun, JP;
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract
A sheet screen is provided on one of sides of test glass, and a projected image of the test glass is electronically and directly picked up. After tone image signals of the test glass thus picked up are binarized while modifying threshold values according to brightness of a background in the tone image, the number of fragments, the area of the greatest fragment and the length of the longest fragment are calculated. Thus, operations, such as calculating the number of the fragments, can be automatically performed by directly picking up an image of the test glass, allowing a fragmentation test to be carried out with good operability and high precision.