The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Jan. 03, 2003
Applicant:
Inventor:
Morihiko Hamada, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract
A semiconductor testing apparatus for conducting a conduction test after stabilizing contact between probing pins and a wafer is provided. The semiconductor testing apparatus includes a heat transfer block which is contacted to the probing pins to adjust the temperature of the probing pins to a predetermined testing temperature before the probing pins are brought into contact with the wafer.