The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2004
Filed:
Apr. 03, 2000
Applicant:
Inventors:
John M. Butler, Menlo Park, CA (US);
Jia Li, Union City, CA (US);
Joseph A. Monforte, Berkeley, CA (US);
Christopher H. Becker, Palo Alto, CA (US);
Assignee:
Sequenom, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C07H 2/102 ; C12P 1/734 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C07H 2/102 ; C12P 1/734 ;
Abstract
The present invention is related to the fields of genetic mapping and genetic identity detection, including forensic identification and paternity testing. This invention is more specifically directed to the use of mass spectrometry to detect length variation in DNA nucleotide sequence repeats (including variants of common alleles), such as microsatellites and short tandem repeats, and to DNA sequences provided as primers for the analysis of DNA tandem nucleotide repeat polymorphisms at specific loci on specific chromosomes.