The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2004

Filed:

Jun. 28, 2002
Applicant:
Inventors:

Phil Meyler, Cardiff, GB;

Rudi Labarbe, Cardiff, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/122 ; G01K 1/700 ; G01K 1/300 ; G01H 5/00 ;
U.S. Cl.
CPC ...
G01K 1/122 ; G01K 1/700 ; G01K 1/300 ; G01H 5/00 ;
Abstract

The present invention relates to a method, a measuring cell and a system for measuring very small heat changes in a sample. The system comprises a measuring cell for containing the sample during the measurement process, at least one electromagnetic radiation unit for radiating one or several samples with modulated monochromatic or polychromatic radiation inside said measuring cell . Said measuring cell comprises at least one acoustic transducer for generating a first output signal V(t) and at least one heat measuring device for generating a second output signal T(t). Both signals are connectable to a combining unit that generates an information signal by means of a reference signal f(t). Said information signal is connectable to a signal processing unit for determining at least one relevant reaction parameter as a function of the measured heat change.


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