The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2004

Filed:

Oct. 18, 2002
Applicant:
Inventors:

Mamoru Arikawa, Wako, JP;

Shigeru Kanehara, Wako, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 2/110 ;
U.S. Cl.
CPC ...
G01B 2/110 ;
Abstract

A free-state diameter (a diameter in a state in which a residual stress has been released by cutting) of each of metal rings in a continuously variable transmission) is determined so that a predetermined compression stress and a predetermined tensile stress are applied to outer and inner surfaces of the metal ring in an endless state in which the metal ring is not cut, respectively. When the metal ring is cut in order to measure the free-state diameter, the metal ring is cut at least at two points so that cut ends do not interfere with each other in the free state, and the free-state diameter is then measured. Thus, the free-state diameter of the metal ring in a continuously variable transmission can be accurately measure.


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