The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2004
Filed:
Jan. 09, 2002
Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);
Ronald Eugene Shaffer, Clifton Park, NY (US);
General Electric Company, Nishayuna, NY (US);
Abstract
The present invention provides methods and an apparatus for the rapid analysis of data from imaging, spectroscopic, scanning probe, or sensor methods. By application of mathematical transform analysis such as wavelet transform algorithms to one or multi-order data sets obtained from individual samples or sample arrays, the analytical features of the data are preserved while undesired noise is removed, thereby reducing the integration time by more than 10-fold in subsequent measurements. The reduction in integration time enables the high-throughput measurement of combinatorial libraries and rapid dynamic processes, while still providing a signal-to-noise level suitable for a reliable measurement.