The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

Jun. 22, 2001
Applicant:
Inventors:

Kenny C. Gross, San Diego, CA (US);

David M. Fishman, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/130 ;
U.S. Cl.
CPC ...
G06F 1/130 ;
Abstract

One embodiment of the present invention provides a system that facilitates measuring quality-of-service of a computer network server or collection of servers by determining the effect that transactions in one category of service have on transactions in other categories of service. The system operates by generating a varying pattern of synthetic transactions for one category of service and a fixed pattern of synthetic transactions for the other categories of service. The system sends the varying pattern and the fixed pattern of synthetic transactions and receives responses to these patterns across a network between the computer network servers and the synthetic transaction generator. The system measures the response time for the varying pattern of synthetic transactions and the response time for the fixed pattern of synthetic transactions. Additionally, the system calculates the effect of transactions in one category of service on response times in the other category of service.


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