The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

Jan. 03, 2002
Applicant:
Inventors:

Masahiko Inoue, Chiyoda, JP;

Toshihiko Horiuchi, Ushiku, JP;

Yasuyuki Momoi, Ushiku, JP;

Takao Konno, Minori, JP;

Wataru Yamagishi, Abiko, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/700 ;
U.S. Cl.
CPC ...
G01F 1/700 ;
Abstract

A calculating device and method provided for a shaking test apparatus for carrying out a shaking test on a structure by using a partial structure and a numerical model which is virtually connected to the partial structure. The calculating device includes a calculation part which identifies a vibration model corresponding to the partial structure on the basis of displacement and reaction force detected in response to shaking and which combines the vibration model and the numerical model with each other to construct a model of the overall system corresponding to the structure and calculates the shaking response of the overall system model.


Find Patent Forward Citations

Inoue, Masahiko. (2004). Shaking test apparatus and method for structures (U.S. Patent No. 6763311). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6763311

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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