The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2004
Filed:
Sep. 13, 2002
Applicant:
Inventor:
Nikolaos Bernitsas, Sugar Land, TX (US);
Assignee:
GX Technology Corporation, Houston, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G01V 1/00 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G01V 1/00 ;
Abstract
A method for improving illumination analysis in seismic data having steps of: selecting a model of the medium, a source and a receiver, a reflecting surface, finding a reflection point and the associated Fresnel zone according to Fermat principle using ray tracing, calculating the illumination in the Fresnel zone using the wave equation, repeating the illumination calculation for all frequencies all points on the reflecting surface and all source and the receiver pairs. The resulting illumination image may be used to assess the quality of or improve the seismic image of the same medium.