The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

Dec. 05, 2001
Applicant:
Inventors:

Atsushi Watanabe, Tokyo, JP;

Tetsuya Kosaka, Yamanashi, JP;

Katsutoshi Takizawa, Yamanashi, JP;

Fumikazu Warashina, Yamanashi, JP;

Kazunori Ban, Yamanashi, JP;

Makoto Yamada, Yamanashi, JP;

Akihiro Terada, Fujiyoshida, JP;

Mitsuhiro Okuda, Yamanashi, JP;

Assignee:

Fanuc Ltd., Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 1/900 ;
U.S. Cl.
CPC ...
G05B 1/900 ;
Abstract

An image of a reference object is captured using a camera and displayed. A measurement starting point is pointed by an image position pointing device. A corresponding view line is obtained using a position on the image and a position and a direction of the camera, a robot approaches to the reference object such that it does not deviate from a projecting direction to move to a position suitable for measurement. A light is projected on the reference object and measurement of an inclination of a face of the object in the vicinity of a measuring point is started. An image including a bright line image on the reference object is photographed and 3-dimensional positions of points sequentially measured along a working line. A movement path of a robot is created using these positions as teaching points for a working robot.


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