The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

May. 29, 2001
Applicant:
Inventor:

Yuen-Wen Lee, Milpitas, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/30 ;
U.S. Cl.
CPC ...
H04N 7/30 ;
Abstract

Methods and apparatus are provided for selecting a cut-off index to filter transform coefficients associated with an input bitstream to provide filtered transform coefficients associated with a rescaled output bitstream. An arrangement of transform coefficients associated with an input data sequence (e.g. an audio segment or a video image block) is filtered using a cut-off index to provide modified transform coefficients associated with a modified output data sequence. Information including information about the input data sequence and the modified output data sequence can be used to update the filter cut-off index for reduction of future data sequences.


Find Patent Forward Citations

Lee, Yuen-Wen. (2004). Methods and apparatus for selecting a cut-off index (U.S. Patent No. 6763070). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6763070

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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