The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2004
Filed:
Dec. 21, 2000
Applicant:
Inventors:
Kai Yiu Lam, Torrance, CA (US);
Loi Han, Alhambra, CA (US);
Assignee:
Microtek International, Inc., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract
An improved high resolution scanner for use in a conventional scanner housing. A plurality of mirrors, including a two-position switchable mirror adapted to sequentially scan a first column, and then a second column, is mounted on a carriage which also includes a conventional lens and CCD for sequentially scanning an object to be scanned in a two-pass scan. The resulting scanned portions, when combined, produce a high resolution image of the scanned image.