The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

Jan. 17, 2003
Applicant:
Inventors:

Adrian Alden, Ottawa, CA;

Peter Bouliane, Ottawa, CA;

Ming Zhang, Ottawa, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/00 ;
U.S. Cl.
CPC ...
H01Q 3/00 ;
Abstract

A method and apparatus for measuring an electromagnetic field are disclosed. In accordance with the apparatus an array of substantially identical antenna elements having a substantially shorter length than a wavelength of the electromagnetic field and being equi-spaced are provided. The spacing is larger than approximately three times the length of the antenna elements. Each antenna element is for sensing the electromagnetic field at a predetermined location and for providing a signal in dependence upon the sensed field. By providing antenna elements meeting the criteria set out herein accurate electromagnetic field strengths are measurable absent significant mutual coupling and scattering effects between the antenna elements.


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